root@Knoppix:/ramdisk/home/knoppix# smartctl -a /dev/sda
smartctl version 5.37 [i686-pc-linux-gnu] Copyright (C) 2002-6 Bruce Allen
Home page is [url]http://smartmontools.sourceforge.net/[/url]
=== START OF INFORMATION SECTION ===
Model Family: Western Digital Caviar SE16 family
Device Model: WDC WD5000KS-00MNB0
Serial Number: WD-WCANU1190814
Firmware Version: 07.02E07
User Capacity: 500.107.862.016 bytes
Device is: In smartctl database [for details use: -P show]
ATA Version is: 7
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Mon Nov 10 22:01:28 2008 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: FAILED!
Drive failure expected in less than 24 hours. SAVE ALL DATA.
See vendor-specific Attribute list for failed Attributes.
General SMART Values:
Offline data collection status: (0x84) Offline data collection activity
was suspended by an interrupting command from host.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (13560) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 170) minutes.
Conveyance self-test routine
recommended polling time: ( 6) minutes.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 200 200 051 Pre-fail Always - 0
3 Spin_Up_Time 0x0003 231 220 021 Pre-fail Always - 5450
4 Start_Stop_Count 0x0032 099 099 000 Old_age Always - 1210
5 Reallocated_Sector_Ct 0x0033 117 117 140 Pre-fail Always FAILING_NOW 664
7 Seek_Error_Rate 0x000f 170 170 051 Pre-fail Always - 469
9 Power_On_Hours 0x0032 096 096 000 Old_age Always - 3121
10 Spin_Retry_Count 0x0013 100 100 051 Pre-fail Always - 0
11 Calibration_Retry_Count 0x0012 100 100 051 Old_age Always - 0
12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 1208
194 Temperature_Celsius 0x0022 253 253 000 Old_age Always - 37
196 Reallocated_Event_Count 0x0032 193 193 000 Old_age Always - 7
197 Current_Pending_Sector 0x0012 200 200 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0010 200 200 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 199 000 Old_age Always - 5
200 Multi_Zone_Error_Rate 0x0009 200 200 051 Pre-fail Offline - 0
SMART Error Log Version: 1
ATA Error Count: 765 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 765 occurred at disk power-on lifetime: 3121 hours (130 days + 1 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 e7 f2 34 ec Error: UNC at LBA = 0x0c34f2e7 = 204796647
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 01 e7 f2 34 0c 00 00:09:25.873 READ DMA
27 00 00 00 00 00 00 00 00:09:25.873 READ NATIVE MAX ADDRESS EXT
ec 00 00 00 00 00 00 02 00:09:25.866 IDENTIFY DEVICE
ef 03 45 00 00 00 00 02 00:09:25.860 SET FEATURES [Set transfer mode]
27 00 00 00 00 00 00 00 00:09:25.860 READ NATIVE MAX ADDRESS EXT
Error 764 occurred at disk power-on lifetime: 3121 hours (130 days + 1 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 e7 f2 34 ec Error: UNC at LBA = 0x0c34f2e7 = 204796647
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 01 e7 f2 34 0c 00 00:09:23.952 READ DMA
27 00 00 00 00 00 00 00 00:09:23.952 READ NATIVE MAX ADDRESS EXT
ec 00 00 00 00 00 00 02 00:09:23.944 IDENTIFY DEVICE
ef 03 45 00 00 00 00 02 00:09:23.938 SET FEATURES [Set transfer mode]
27 00 00 00 00 00 00 00 00:09:23.938 READ NATIVE MAX ADDRESS EXT
Error 763 occurred at disk power-on lifetime: 3121 hours (130 days + 1 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 e7 f2 34 ec Error: UNC at LBA = 0x0c34f2e7 = 204796647
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 01 e7 f2 34 0c 00 00:09:22.030 READ DMA
27 00 00 00 00 00 00 00 00:09:22.030 READ NATIVE MAX ADDRESS EXT
ec 00 00 00 00 00 00 02 00:09:22.022 IDENTIFY DEVICE
ef 03 45 00 00 00 00 02 00:09:22.017 SET FEATURES [Set transfer mode]
27 00 00 00 00 00 00 00 00:09:22.017 READ NATIVE MAX ADDRESS EXT
Error 762 occurred at disk power-on lifetime: 3121 hours (130 days + 1 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 e7 f2 34 ec Error: UNC at LBA = 0x0c34f2e7 = 204796647
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 01 e7 f2 34 0c 00 00:09:20.108 READ DMA
27 00 00 00 00 00 00 00 00:09:20.108 READ NATIVE MAX ADDRESS EXT
ec 00 00 00 00 00 00 02 00:09:20.101 IDENTIFY DEVICE
ef 03 45 00 00 00 00 02 00:09:20.095 SET FEATURES [Set transfer mode]
27 00 00 00 00 00 00 00 00:09:20.095 READ NATIVE MAX ADDRESS EXT
Error 761 occurred at disk power-on lifetime: 3121 hours (130 days + 1 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 e7 f2 34 ec Error: UNC at LBA = 0x0c34f2e7 = 204796647
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 01 e7 f2 34 0c 00 00:09:17.574 READ DMA
27 00 00 00 00 00 00 00 00:09:17.574 READ NATIVE MAX ADDRESS EXT
ec 00 00 00 00 00 00 02 00:09:17.566 IDENTIFY DEVICE
ef 03 45 00 00 00 00 02 00:09:17.561 SET FEATURES [Set transfer mode]
27 00 00 00 00 00 00 00 00:09:17.561 READ NATIVE MAX ADDRESS EXT
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
root@Knoppix:/ramdisk/home/knoppix#